Reliability and Failure of Electronic Materials and Devices

Author: Milton Ohring
Edition: 1
Binding: Hardcover
ISBN: 0125249853

Reliability and Failure of Electronic Materials and Devices

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Get Reliability and Failure of Electronic Materials and Devices computer books for free.
Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, Check Reliability and Failure of Electronic Materials and Devices our best computer books for 2013. All books are available in pdf format and downloadable from rapidshare, 4shared, and mediafire.

Reliability and Failure of Electronic Materials and Devices Free

Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data An underlying thread of the book concerns product defects--their relation to yield and reliability,

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