VLSI Test Principles and Architectures

Author: Laung-Terng Wang
Edition: 1
Binding: Kindle Edition
ISBN: B004NYAS1U

VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Get VLSI Test Principles and Architectures computer books for free.
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A Most up-to-date coverage of design for testability.
A Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
A Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
A Lecture slides and exercise solutions for all chapters are now available.
A Instructors are also eligible for downloading PPT slide files and MSWORD solutions files Check VLSI Test Principles and Architectures our best computer books for 2013. All books are available in pdf format and downloadable from rapidshare, 4shared, and mediafire.

VLSI Test Principles and Architectures Free

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A Most up-to-date coverage of design for testability.
A Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
A Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
A Lecture slides and exercise solutions for all chapters are now available r />

A Most up-to-date coverage of design for testability.
A Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
A Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
A Lecture slides and exercise solutions for all chapters are now available.
A Instructors are also eligible for downloading PPT slide files and MSWORD solutions files

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